Advanced Analysis and Data Processing
To provide deeper insight and achieve the highest level of precision, we utilize a comprehensive suite of analytical methods. These include spatial filtering and advanced data manipulation, detailed measurement comparison and deviation mapping, Zernike polynomial fitting, and accurate surface reconstruction. Additional capabilities, such as spherical compensation and synthetic surface generation, allow us to interpret complex datasets and refine measurement outputs, ensuring that results are both precise and practically applicable.
Advanced Analysis and Data Processing
To provide deeper insight and achieve the highest level of precision, we utilize a comprehensive suite of analytical methods. These include spatial filtering and advanced data manipulation, detailed measurement comparison and deviation mapping, Zernike polynomial fitting, and accurate surface reconstruction. Additional capabilities, such as spherical compensation and synthetic surface generation, allow us to interpret complex datasets and refine measurement outputs, ensuring that results are both precise and practically applicable.
Advanced Analysis and Data Processing
To provide deeper insight and achieve the highest level of precision, we utilize a comprehensive suite of analytical methods. These include spatial filtering and advanced data manipulation, detailed measurement comparison and deviation mapping, Zernike polynomial fitting, and accurate surface reconstruction. Additional capabilities, such as spherical compensation and synthetic surface generation, allow us to interpret complex datasets and refine measurement outputs, ensuring that results are both precise and practically applicable.
Instruments
Instruments
Instruments
OPMI-S
The OPMI-S is a universal industry ready Fizeau interferometer with digital zoom, designed for measuring flat, spherical optical surfaces.
full specs
OPMI-S
The OPMI-S is a universal industry ready Fizeau interferometer with digital zoom, designed for measuring flat, spherical optical surfaces.
full specs
OPMI-S
The OPMI-S is a universal industry ready Fizeau interferometer with digital zoom, designed for measuring flat, spherical optical surfaces.
full specs
OPMI-T
The OPMI-T is an advanced Fizeau interferometer with digital zoom and a tunable laser source, designed for measuring flat and spherical optical surfaces. The OPMI-T offers a wide tunable range, enabling multiple surface measurements in a single acquisition.
full specs
OPMI-T
The OPMI-T is an advanced Fizeau interferometer with digital zoom and a tunable laser source, designed for measuring flat and spherical optical surfaces. The OPMI-T offers a wide tunable range, enabling multiple surface measurements in a single acquisition.
full specs
OPMI-T
The OPMI-T is an advanced Fizeau interferometer with digital zoom and a tunable laser source, designed for measuring flat and spherical optical surfaces. The OPMI-T offers a wide tunable range, enabling multiple surface measurements in a single acquisition.
full specs
Plano Expander
A large-aperture (4inch up to 12 inch) expander designed to extend the measurement capabilities of OPMI – S and OPMI - T units for the characterization of optical surface shapes.
full specs
Plano Expander
A large-aperture (4inch up to 12 inch) expander designed to extend the measurement capabilities of OPMI – S and OPMI - T units for the characterization of optical surface shapes.
full specs
Plano Expander
A large-aperture (4inch up to 12 inch) expander designed to extend the measurement capabilities of OPMI – S and OPMI - T units for the characterization of optical surface shapes.
full specs
AI ZOOM SWIR
Fizeau interferometer for the short-wave infrared (SWIR) range, with phase shifting and optical zoom.
full specs
AI ZOOM SWIR
Fizeau interferometer for the short-wave infrared (SWIR) range, with phase shifting and optical zoom.
full specs
AI ZOOM SWIR
Fizeau interferometer for the short-wave infrared (SWIR) range, with phase shifting and optical zoom.
full specs
AWA FH
AWA I (Absolute Wavefront Analyzer, Full Hemisphere) is a measurement system for precise shape analysis of large spherical or dome surfaces up to 250 mm in diameter. Its robust design and advanced algorithms enable highly repeatable measurements of parallel optical elements without the need for surface treatment or immersion.
full specs
AWA FH
AWA I (Absolute Wavefront Analyzer, Full Hemisphere) is a measurement system for precise shape analysis of large spherical or dome surfaces up to 250 mm in diameter. Its robust design and advanced algorithms enable highly repeatable measurements of parallel optical elements without the need for surface treatment or immersion.
full specs
AWA FH
AWA I (Absolute Wavefront Analyzer, Full Hemisphere) is a measurement system for precise shape analysis of large spherical or dome surfaces up to 250 mm in diameter. Its robust design and advanced algorithms enable highly repeatable measurements of parallel optical elements without the need for surface treatment or immersion.
full specs
AWA ASPH
The AWA ASPH is a production-ready measurement system for precise characterization of complex aspheric optical surfaces. Building on the AWA FH platform, it extends its capabilities through advanced optical modeling, optical twin approaches, and GPU-accelerated computation. The system is based on a common-path Fizeau interferometer with a slightly tunable laser source, enabling robust measurements with reduced sensitivity to environmental disturbances. It supports both lateral and annular stitching and integrates high-precision 6-axis positioning for flexible measurement configurations.
full specs
AWA ASPH
The AWA ASPH is a production-ready measurement system for precise characterization of complex aspheric optical surfaces. Building on the AWA FH platform, it extends its capabilities through advanced optical modeling, optical twin approaches, and GPU-accelerated computation. The system is based on a common-path Fizeau interferometer with a slightly tunable laser source, enabling robust measurements with reduced sensitivity to environmental disturbances. It supports both lateral and annular stitching and integrates high-precision 6-axis positioning for flexible measurement configurations.
full specs
AWA ASPH
The AWA ASPH is a production-ready measurement system for precise characterization of complex aspheric optical surfaces. Building on the AWA FH platform, it extends its capabilities through advanced optical modeling, optical twin approaches, and GPU-accelerated computation. The system is based on a common-path Fizeau interferometer with a slightly tunable laser source, enabling robust measurements with reduced sensitivity to environmental disturbances. It supports both lateral and annular stitching and integrates high-precision 6-axis positioning for flexible measurement configurations.
full specs