AWA ASPH

The AWA ASPH enables high-precision measurement of complex aspheric shapes by combining interferometric data with advanced optical modeling. The use of calibrated optical twins allows compensation of retrace and other systematic errors, improving reconstruction accuracy and enabling reliable measurements even in undersampled regions of the interferogram. For moderately complex aspheres, the system allows precise surface measurement in a single position. In the case of steep aspheric geometries prone to vignetting, multiple axial measurements are performed and combined using stitching to reconstruct the full surface error map. GPU-accelerated computation supports efficient processing of large datasets and complex reconstruction algorithms, enabling practical deployment in production environments. The system is suitable for a wide range of advanced optical components, including strongly aspheric and freeform-like surfaces.

KEY FEATURES: 

Integratedwith OPMI – S and OPMI -T units

6 axis positioning system

Thermally compensated mechanical structure

Lateral and annular stitching capabilitiesPrecision measurement of aspheric surfaces using multi-position strategiesSingle- and dual-wavelength measurement modesSoftware for measurement lattice design stitching and evaluation of data in semiautomatic mode

Radius measurement capability in semi-automatic modeLarge flat and sphere measurement using stitching

Measurement of large flat and spherical surfaces using stitching