AWA FH

The system enables accurate measurement of large optical surfaces through lateral stitching, extending the effective measurement aperture up to 250 mm. It is suitable for high-precision characterization of spherical, dome-shaped, and flat optical components. Thanks to wavelength tuning and dedicated algorithms, the AWA FH allows simultaneous measurement of optical elements with parallel geometry (such as domes, meniscus lenses, and optical flats) without the need for immersion or surface treatment (e.g. blackening of the second surface). Its mechanical stability and controlled measurement workflow ensure reliable and repeatable results, making it suitable for both industrial and research applications.

KEY FEATURES: 

Integrated with OPMI – S and OPMI -T units

6 axis positioning system

Thermally compensated mechanical structure

Lateral stitching for large-aperture measurements Semi-automatic measurement sequence and evaluation software

Radius measurement capability in semi-automatic mode